Unlike Scanning Electron Microscopy that bounces electrons off the surface of a sample to produce an image, Transmission Electron Microscopes (TEMs) shoot the electrons completely through the sample.

The FIB uses a variation on the Everhart-Thornley (ET) secondary electron detector. Secondary ions are also produced in the beam-specimen volume and can be used for imaging; however, the Hitachi ...

Scientists have calculated how it is possible to look inside the atom to image individual electron orbitals. An electron microscope can't just snap a photo like a mobile phone camera can. The ability ...

It may not have won an Oscar, but the tiny electron has finally made its film debut. A new video shows how an electron rides on a light wave after just having been pulled away from an atom. This is ...

image: The metallic tip of a scanning tunneling microscope drives the magnetic quantum state of an iron atom into a different direction while injected electrons destroy this state superposition. This ...

Carbon nanotube field emitters are at present the brightest available electron sources but must operate at low currents to avoid Coulomb expansion and are therefore not suitable for ultrafast imaging.

(Nanowerk News) A novel technique that nudges single atoms to switch places within an atomically thin material could bring scientists another step closer to realizing theoretical physicist Richard ...