Scanning electron microscopy (SEM), along with key analytical techniques, such as energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), are essential for advanced materials ...

In this interview, Dr. Joshua Lea explores the role of the integration of Raman spectroscopy with SEM technology for advanced materials analysis. Can you introduce yourself and the topic you will be ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

Continued scaling of integrated circuits to smaller dimensions is still a viable way to increase compute power, achieve higher memory cell density, or reduce power consumption. These days, chip makers ...

Nanomaterials are used in various fields due to their distinct size-dependent properties, and accurate characterization is essential to optimize and design them for specific applications. 1 For ...