Researchers have succeeded in creating a 'superlattice' of semiconductor quantum dots that can behave like a metal, potentially imparting exciting new properties to this popular class of materials.
Classification and Localization of Semiconductor Defect Classes in Aggressive Pitches (imec, Screen)
A new technical paper titled “An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection” was published by Imec and SCREEN SPE Germany. “Deep learning-based semiconductor ...
A research team led by NIMS has, for the first time, produced nanoscale images of two key features in an ultra-thin material: ...
Korea Polytechnic University announced on November 8 that the research team led by Professor Nam Okhyun from the Department ...
Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
The competitive landscape of the semiconductor inspection system market is defined by strategic mergers, technological ...
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