Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

Detection and monitoring of the yield loss mechanisms and defects in product chips have been a subject of extensive efforts, resulting in multiple useful Design-for-Manufacturing (DFM) and ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.