A leading Chinese wafer foundry, Epiworld International Co. Ltd., has filed to list its shares on the Hong Kong Stock Exchange, looking to invest the proceeds in technical knowhow and productive ...

and it is driving innovations in both inspection techniques and wafer test map analysis. At the wafer level, a macro-defect can affect more than one die, and in some cases large regions of a wafer.

Wafer singulation (a.k.a. dicing), with wafer map providing data on pass/fail die locations; Assembly process results in packaged product, and Packaged part testing, where package bumps or pins ...

Layout scale factor for each Layer. Layout scaling is done before fracturing or after it. DRC tool layer map file is created to map gds layers in calibre. Example is for calibre layer map: Layer 1;0 1 ...

We analyze radial process parameter distributions, which, wafer maps show, are predominant and prove that they give rise to a semi-elliptical, not normal, distribution. Additionally, we discuss ...

About this template: This project have source code of SINF3 Exporter and another library to test it. And this projects will calls SINF3 Map Loader library to load map data from SINF3 map files, then ...

STDF, which is a Standard Test Data Format, is a proprietary file format for semiconductor test information heavily used in Semi-conductor wafer test and packaged test. Develop a python GUI(tkinter ...

He hasn't really told us yet what this means The admission came toward the end of a roughly an hour-and-a-half-long product strategy update that was dominated more by customer testimonials than ...