Semiconductor wafer defect classification is critical for ensuring high precision and yield in manufacturing. Traditional CNN-based models often struggle with class imbalances and recognition of the ...

About this template: This project have source code of SINF3 Exporter and another library to test it. And this projects will calls SINF3 Map Loader library to load map data from SINF3 map files, then ...

The system was calibrated using the Raman band at 520 cm –1 of a silicon wafer, which was also used to control the temporal stability of the Raman setup performance. Sample Preparation ... 2D ...

Find historical weather by searching for a city, zip code, or airport code. Include a date for which you would like to see weather history. You can select a range of dates in the results on the ...

Department of Electrical Engineering and Computer Science, DGIST, Daegu 42988, Republic of Korea Convergence Research Advanced Centre for Olfaction, DGIST, Daegu 42988, Republic of Korea ...